HCATS-101 Test System


The Hyper Custom ATS (HCATS) is an economical, Commercial-Off-The-Shelf (COTS), flexible test system based on our proven open architecture of commercial equipment and modular system design principles. Its primary use is as Automatic Test Equipment (ATE), either through test programming languages or by the use of the latest object-oriented graphical programming interfaces. The packaging allows for easy access to all of the modules and provides room for expansion. The interface provides over 200 universal analog test points, 192 dynamic digital test points, 64 static digital test points, and an impedance-matched integrated instrument backplane to reduce the number and complexity of ITAs.

State-of-the-Art Technology

The HCATS-101 features PXI, VXI, LXI and IP modular technologies to provide the required testing capabilities in a compact workstation.

High Speed Dynamic Digital

The I/O pins are per clock bi-directional and operate at up to 50 MHz. One Meg of memory are behind each pin, which can be run continuously or in segments for multiple tests. LASAR Post Processing, fault dictionaries and guided probe capabilities are included.

Multiple Programmable DC and Variable DC Power Supplies

The power system is designed to meet the challenges of high tech ATE. This specific group is designed to meet the needs of the Comet and DTS70 Unit Under Test (UUT) requirements.

Operating Environment

The standard operating environment is Windows®. The software package installed is TCASE, which encompasses all of the runtime system software. The typical environment includes software libraries to execute TBasic test programs and numerous ATS operation and maintenance utilities. Also included are runtime engines which support IVI compliant OEM objects and National Instruments VISA, Labview™, and Labwindows™.

Measurement Capability to 330 MHz

Dedicated RF channels are used to route signals of up to 3 GHz to the analog bus; however, instrument measurement capability in the standard configuration is to 330 MHz.


Dynamic Digital

192 I/O Pins
50 MHz pattern rate
1Megabit per pin memory depth
Program Selectable voltage levels (Programmable option available)
External triggering
External clocking
(options for additional digital pins are available)

Measurement Capability Highlights

Four simultaneous inputs
AC/DC Voltage: Range: 100 mV to 300 V
Resolution: 10 nV to 100 mV
Resistance (2/4 Wire): Range: 100 Ohm to 100 M Ohm
Resolution: 30 µOhm to 30 Ohm
Frequency: Range: 0.001 Hz to 200 MHz
Period: Range: 5 ns to 1000 s
Resolution: 9 digits
Time Interval: Range: 1 ns to 1000 s
Resolution: 2 ns + trigger error (avg)
Rise/Fall Time Range: 15 ns to 1000 s
Pulse Width Range: 5 ns to 1 ms
Totalize Range: 0 to [(1.E + 12) - 1]
Bandwidth: DC to 330 MHz
Maximum Sample Rate: 5 GSa/s
Total Harmonic Distortion:
Fundamental Frequency: 10 Hz to 100 kHz
Accuracy: <110 KHz ±0.7db

Stimulus Capability Highlights

Two Simultaneous outputs
Arbitrary Waveforms
13-bit resolution, 40 MSa/s
256K sample memory with sequencer (custom waveforms)
Built-In Functions
Frequency Range: Sine: to 10.7 MHz
Square: to 5 MHz
Triangle/Ramp: to 100 kHz
Amplitude (50 Ohm): Range: ±5.1 V
Resolution: 1.25 µV
Amplitude (Open): Range: ±10.2 V
Resolution: 2.5 µV
Built-in Modes
Frequency Sweep to 10 MHz
Frequency Hop to 10 MHz
Frequency Shift to 2 M changes/s
Phase Modulate to 500 kHz
Precision PLL Waveform Synthesizer
Frequency Range: Sine: 100 Hz to 50 MHz
Triangle: 100 Hz to 1 MHz
Square: 100 Hz to 50 MHz
Pulse/Ramp: 100 Hz to 1 MHz
Sinc: 100 Hz to 1 MHz
Gaussian: 100 Hz to 1 MHz
Exponential: 100 Hz to 1 MHz
Frequency Resolution: 4 digits
Amplitude: 20 mV p-p to 32 V p-p output open circuit
10 mV p-p to 16 V p-p into 50 Ohm
Four programmable DC supplies
Resolution: 10 mVA
Range: 2 channels, 0 to 8 Vdc 50W
1 Channel, 0 to 20 Vdc 50W
1 Channel, 0 to 35 Vdc 50W
Two variable DC supplies
1 Channel +15 Vdc 25W
1 Channel -15 Vdc 25W

Universal Analog Switching

Maximum Current: 1 Amp, > 200 Universal Analog Test Points